A development of lifetime measurement based on the differential decay curve method
查看参考文献11篇
文摘
A new development of indirect gating case in the differential decay curve method used for lifetime measurement has been introduced.The gate region was extended from partial shifted peak to both shifted and unshifted components.The statistics of flight and stop peaks in gating spectra was improved obviously.The reliability of this change has been tested by reanalysing the lifetime of 2~+ state in ~(134)Ce.The result of 32.2(33)ps was fit well with the previous published values within the experimental uncertainty.The developed method was also used to analyse the lifetime of 2_1~+ state in ~(138)Nd.
来源
Nuclear Science and Techniques
,2018,29(8):108-1-108-7 【核心库】
DOI
10.1007/s41365-018-0453-6
关键词
Lifetime
;
The differential decay curve method
;
Gating region
地址
1.
China Institute of Atomic Energy, Beijing, 102413
2.
College of Physics,Jilin University, Changchun, 621010
3.
Shenyang Institute of Engineering, Shenyang, 110136
语种
英文
文献类型
研究性论文
ISSN
1001-8042
学科
物理学
基金
国家自然科学基金
;
the National Natural Science Foundation of Guangdong,China
;
国家科技攻关计划项目
;
the National Key Scientific Instrument and Equipment Development Projects,China
文献收藏号
CSCD:6292269
参考文献 共
11
共1页
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