铜导线短路熔痕的XPS研究
XPS Analysis of Beads Formed by Fuse Breaking of Electric Copper Wire
查看参考文献18篇
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文摘
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利用氩离子溅射对熔痕样品进行了深度刻蚀, 同时利用Cu的俄歇谱线和计算的俄歇参数值, 对不同环境形成的铜导线短路痕迹的物相及元素分布规律进行了分析. 根据刻蚀时间可将一次短路熔痕表面膜层分为三部分, 即C含量迅速减少的近表面层; O含量变化不大, C含量逐渐消失且有Cu_2O相的中间层;无Cu_2O相, O含量显著减少的过渡层. 而将二次短路熔痕表面膜层分为两部分: C含量迅速减少的近表面层;无Cu_2O相, C和O量逐渐减少层. 由此可见, 一次短路熔痕的表面膜层与基体分界明显, 有显著的过渡层, 而二次短路熔痕的表面膜层与基体分界不明显, 无过渡层. 综上所述, 可以根据两种短路熔痕是否含有Cu_2O相以及定量分析结果来区分两种熔痕, 为判断火灾原因提供新的技术依据. |
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其他语种文摘
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The in-depth composition of beads formed by fuse breaking of the electric copper wire in different circumstances was studied by XPS with Ar+ion sputtering. In addition, the measured Auger spectra and the calculated Auger parameters were compared for differentiation of the substances of Cu and Cu_2O. Corresponding to the sputtering depth, the molten product on a bead induced directly by fuse breaking of the copper wire without cover may be distinguished as three portions: surface layer with a drastic decrease in carbon content; intermediate layer with a gentle change in oxygen content and gradually diminished carbon peak, and consisting of Cu_2O; transition layer without Cu_2O and with a rapid decrease in oxygen content. While the molten product on a bead formed by fuse breaking of the cupper wire after its insulating cover had been burned out may be distinguished as two portions: surface layer with carbon content decreasing quickly; subsurface layer without Cu_2O and with carbon and oxygen content decreasing gradually. Thus, it can be seen that there was an obvious interface between the layered surface product and the substrate for the first type of bead, while as to the second type of bead there was no interface. As a result, the presence of Cu_2O and the quantitative results can be used to identify the molten product on a bead induced directly by fuse breaking of the copper wire without cover and the molten product on a bead formed by fuse breaking of the cupper wire after its insulating cover had been burned out, as a complementary technique for the judgments of fire cause. |
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来源
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光谱学与光谱分析
,2010,30(5):1408-1412 【核心库】
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DOI
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10.3964/j.issn.1000-0593(2010)05-1408-05
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关键词
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深度刻蚀
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光电子能谱
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俄歇参数
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短路熔痕
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地址
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公安部沈阳消防研究所, 火灾现场勘验与物证鉴定公安部重点实验室, 辽宁, 沈阳, 110034
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语种
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中文 |
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文献类型
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研究性论文 |
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ISSN
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1000-0593 |
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学科
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物理学 |
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基金
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国家科技支撑计划项目
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公安部重点研究计划项目
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国家公安部应用创新项目
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文献收藏号
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CSCD:3913758
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