双极运算放大器辐射损伤的时间相关性
Time Dependence of Radiation Damage in Bipolar Operational Amplifiers
查看参考文献12篇
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文摘
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通过一系列辐照实验对双极运放辐射损伤的时间相关性进行了研究.结果表明,双极运放的辐射损伤与时间有着密切的关系,通过调整辐照剂量率、退火温度及时间等参数进行循环辐照-退火实验,可以测评出器件的低剂量率辐射损伤情况,并从界面态角度对这种损伤机理进行了分析. |
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其他语种文摘
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The time dependence of radiation damage in bipolar op-amps is studied through a series of radiation experiments. The results show that radiation damage in bipolar op-amps is closely related to time,and we can evaluate low-dose rate radiation damage in devices by adjusting radiating the dose rate, annealing temperature, and annealing time parameters to experiment on circulating radiation-anneal. From the interface states point of view, the possible mechanisms of radiation damage are also analyzed. |
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来源
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半导体学报
,2006,27(7):1280-1284 【核心库】
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关键词
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双极运算放大器
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辐射损伤
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时间相关性
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低剂量率
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加速评估
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地址
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中国科学院新疆理化技术研究所, 乌鲁木齐, 830011
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语种
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中文 |
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文献类型
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研究性论文 |
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ISSN
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0253-4177 |
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学科
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电子技术、通信技术 |
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文献收藏号
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CSCD:2551457
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参考文献 共
12
共1页
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