GaN基肖特基结构紫外探测器
GaN Schottky Barrier Ultraviolet Detector
查看参考文献14篇
文摘
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在蓝宝石(0001)衬底上采用低压金属有机物化学气相沉积(MOCVD)方法生长GaN外延层结构,以此为材料制作了GaN基肖特基结构紫外探测器.测量了该紫外探测器的暗电流曲线、C-V特性曲线、光响应曲线和响应时间曲线.该紫外探测器在5V偏压时暗电流为0.42nA,在10V偏压时暗电流为38.5nA.在零偏压下,该紫外探测器在250nm~365nm的波长范围内有较高的响应度,峰值响应度在363nm波长处达到0.12A/W,在365nm波长左右有陡峭的截止边;当波长超过紫外探测器的截止波长(365nm左右),探测器的响应度减小了三个数量级以上.该紫外探测器的响应时间小于2μs. |
其他语种文摘
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A GaN Schottky barrier ultraviolet detector is fabricated using GaN films grown on sapphire substrates. Its dark current,C-V,responsivity,and response time are measured at room temperature. The dark current of the detector is 0. 42nA under 5V bias,and 38. 5nA under 10V bias. A maximum responsivity of 0. 12A/W is achieved under the illumination with λ= 363nm light and 0V bias. It exhibits a typical sharp band-edge cutoff at the wavelength of 365nm,and a high responsivity at the wavelength of 250-365nm. The responsivity of the detector drops by nearly three orders of magnitude across the cutoff wavelength (365nm).Its response time is less than 2μs. |
来源
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半导体学报
,2004,25(6):711-714 【核心库】
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关键词
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GaN
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肖特基结构
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紫外探测器
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响应度
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地址
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中国科学院半导体研究所, 集成光电子学国家重点联合实验室, 北京, 100083
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语种
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中文 |
文献类型
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研究性论文 |
ISSN
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0253-4177 |
学科
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电子技术、通信技术 |
基金
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国家863计划
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文献收藏号
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CSCD:1693358
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