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文摘
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研制了一套可应用于MEMS器件的微尺度测量系统,可以在受载状态下实时检测MEMS器件的面内位移、离面位移和三维形貌.该系统中,面内位移测量是一个基于白光数字散斑相关方法的显微光学测量系统,与相应的力学加载系统结合,可以得到MEMS器件在受载状态下的实时面内位移;离面位移和三维形貌测量则是一个基于相移显微投影光栅方法的光学测量系统,与相应的力学加载系统结合,可以得到MEMS器件在受载状态下的实时三维形貌和离面位移.最后给出了几个典型的MEMS器件面内位移、离面位移和三维形貌的实测结果. |
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其他语种文摘
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A micro-scale measurement system applicable to MENS components has been developed. The in-plane displacement, out-of-plane displacement and 3D profile of a loaded MEMS specimen can be measured in real-time with this system. White light digital speckle correlation method is employed in the system in combination with a loading device for in-plane displacement measurement. Phase shifting fringe projection technique is introduced to perform the out-of-plane displacement and 3D profile measurement. When combined with a micro loading device, the system can measure the out-of- plane displacement and the 3D profile of a loaded MEMS specimen in real-time. Finally, several representative experiment results obtained using the developed measurement system are presented. |
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来源
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实验力学
,2007,22(3/4):424-428 【核心库】
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关键词
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微尺度测量
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数字散斑相关
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投影条纹
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相移
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MEMS
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地址
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1.
中国科学技术大学, 中国科学院材料力学行为和设计重点实验室, 合肥, 230026
2.
中国科学院,力学研究所, 非线性力学国家重点实验室, 北京, 100080
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语种
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中文 |
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文献类型
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研究性论文 |
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ISSN
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1001-4888 |
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学科
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力学;一般工业技术 |
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文献收藏号
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CSCD:2950099
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